Technical Reports

Report: Future of Thin Film Measurement
The “Achilles heel” of thin film deposition process monitoring and control is the quartz crystal microbalance, or QCM
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Future of Thin Film Measurement
Report: Temperature & Thin Film Measurement
Quartz crystal film thickness monitors (or QCMs) have been used for years to control vacuum deposition processing of electronic and optical products
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Report: Temperature & Thin Film Measurement
Report: Basics of QCM Technology
The key to a deposition monitoring and control system is the quartz crystal.
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Future of Thin Film Measurement
Report: The Importance of Mastering Temperature
The benefits of independently controlling temperature levels during a thin film process.
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The Importance of Mastering Temperature

Additional Technical Data
Product Datasheets