Temperature–Regulating Film Thickness Controller
When Colnatec re-imagined a new level of dependability and precision in the world of thin film deposition, it became clear that a revolutionary new sensor head would require a completely cutting-edge approach to monitoring and control. Introducing the Eon™ Film Thickness Controller.
Unlike conventional systems that simply supply digital data to a personal computer through a modified oscillator, Eon™ is a combined software and hardware solution that is capable of real-time temperature measurement, heater control, and works alongside the Mirage™ Air Cooling System to maintain stable temperatures in the Tempe™ and Helios™ systems.
The Eon™ is so revolutionary because it is able to measure frequency and temperature simultaneously, allowing for real-time correction of any natural frequency drift in the crystal during heating. Any process that requires heated crystals or high measurement accuracy will see exponential improvement, leading to the highest accuracy possible as well as enabling continuous crystal operation without cooling.
Combining the Eon™ PC Based Film Thickness Controller with Colnatec’s Helios™ or Tempe™ Self-cleaning Sensor Head, Mirage™ Air Cooling System, and HT™ (High Temperature) Crystal allows for a degree of monitoring and control never before imagined in the world of thin film, and is ideal for ALD, CVD, MBE, CIGS solar cell fabrication, and OLED manufacturing or deposition processes.